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3 article(s) from Dagdeviren, Omur E

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

Aaron Mascaro,
Yoichi Miyahara,
Tyler Enright,
Omur E. Dagdeviren and
Peter Grütter

Beilstein J. Nanotechnol. 2019, 10, 617–633, doi:10.3762/bjnano.10.62

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Figure 1: Illustration of ionic transport measurements in the time domain. (a) A conducting AFM tip is brough...

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Figure 2: (a) AFM frequency shift response to stretched-exponential voltage pulses (from 0 to 5 V) with and w...

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Figure 3: (a) Schematic illustration of the voltage-pulse averaging EFM technique: the top shows the applied ...

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Figure 4: Measured tip–sample force as a function of the distance for a gold-coated tip over a grounded gold ...

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Figure 5: “(a) Schematic of the experimental setup: (i) Computer requests a trigger at a defined phase of the...

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Figure 6: Extracted FF-trEFM signals from numerical simulations of tip–sample interactions with a stretched-e...

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Figure 7: “(a) Calibration curve for a range of characteristic times of exponential decay (τ) (inset shows a ...

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Figure 8: “For three representative pulse times, we plot (A) cantilever amplitude; (B) cantilever drive volta...

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Figure 9: “Experiments and simulations demonstrating subcycle time resolution in pk-EFM. (A) Subcycle voltage...

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Figure 10: Synthetic data of cantilever deflection spectrum around the fundamental resonance frequency, ω₀ =2π...

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Figure 11: “Results from simulations and from the experimental validation for the proposed excitation schemes:...

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Supp Info

Review

Published 01 Mar 2019

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Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis

Omur E. Dagdeviren and
Udo D. Schwarz

Beilstein J. Nanotechnol. 2017, 8, 657–666, doi:10.3762/bjnano.8.70

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Figure 1: Figure explaining the model and procedures used throughout the paper. (a) Perspective sketch of all...

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Figure 2: Effect of the tip tilt angle φ on k, f₀, Q, and Δy/Δz for three different epoxy amounts used to att...

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Figure 3: (a–c) Geometrical arrangement and definition of the angle φ for a configuration where the tip is no...

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Figure 4: Model for a configuration where the tip is mounted at the half-length point of the free prong at th...

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Figure 5: Effect of material choice (gold or tungsten), wire diameter (10 µm, 20 µm, or 40 µm), and in-plane ...

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Figure 6: Effect of out-of-plane asymmetry (x–y plane) of the wire used to collect the tunneling current on k...

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Full Research Paper

Published 20 Mar 2017

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Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

Mehmet Z. Baykara,
Omur E. Dagdeviren,
Todd C. Schwendemann,
Harry Mönig,
Eric I. Altman and
Udo D. Schwarz

Beilstein J. Nanotechnol. 2012, 3, 637–650, doi:10.3762/bjnano.3.73

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Figure 1: Schematic drawings illustrating data-acquisition procedures employed to record the atomic-scale sur...

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Figure 2: Isometric (a) and top (b) views of a piezoelectric scan tube employed as a precise positioning tool...

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Figure 3: Schematic drawing describing the elastic deformation/bending of an asymmetric tip apex as the tip–s...

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Figure 4: Planar three-layer tip apex models used in the analytical simulations, featuring close-packed atoms...

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Figure 5: Illustrations of the model surfaces investigated in this section. (a) The Cu(001) surface in FCC co...

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Figure 6: Simulated 2-D force fields over a Cu(001) surface along the [100] direction probed by symmetric (a:...

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Figure 7: Simulated 2-D force fields over the NaCl(001) surface along the [110] direction probed by a symmetr...

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Figure 8: 2-D force fields over the NaCl(001) surface simulated using parameters identical to the correspondi...

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Full Research Paper

Published 11 Sep 2012

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